Determination of intrinsic point defect properties in silicon by analyzing OSF ring dynamics and void formation

Authors: Erich Dornberger, J. Esfandyari, J. Vanhellemont, Robert A. Brown, Talid Sinno, Wilfried von Ammon
Publication Date: March 15, 1998

Citation: E. Dornberger, T. Sinno, J. Esfandyari, J. Vanhellemont, R. A. Brown, and W. von Ammon, Determination of intrinsic point defect properties in silicon by analyzing OSF ring dynamics and void formation. Proceedings of the Fifth International Symposium on High Purity Silicon V. Proc. Electrochem. Soc. (1998) 170-187.

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